Time Table, Session : 2023-2024


 

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Atomic Force Microscope

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Atomic Force Microscope: Principle, Parts, Uses The atomic force  microscope  (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height, friction. The resolution is measured in a nanometer, which is much more accurate and effective than the optical diffraction limit. It uses a probe for measuring and collection of data involves touching the surface that has the probe. An image is formed when the scanning probe microscope raster-scans the probe over a section of the sample, measuring its local properties concurrently. They also have piezoelectric elements, which are electric charges that accumulate in selected solid materials like  DNA , biological proteins, crystal, etc, to enable tiny accurate and precise movement during scanning upon an electric command. The Atomic Force Microscope was invented in 1982, by scientists working in IBM, just after the invention of the Scanning tunneling Microscope in 1980 by Ge...
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MOSFET Scaling

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MOSFET Scaling Scaling definition and types •         High integration of MOSFETs on IC, requires reduction of size of MOSFET. Reducing the size of MOSFET is called as scaling. •         Scaling of MOS transistors is concerned with systematic reduction of overall dimensions of the devices as allowed by the available technology, while preserving the geometric ratios found in the larger devices •         There are two types of scaling o    Constant field scaling/full scaling o    Constant voltage scaling Scaling factor •         constant scaling factor S > 1. •         All horizontal and vertical dimensions of the large-size transistor are then divided by this scaling factor to obtain the scaled device. •         W, L, toxare decreased by ...
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CMOS (Complementary Metal-Oxide-Semiconductor)

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