Subject :- Nano Technology
Atomic Force Microscope
Atomic Force Microscope: Principle, Parts, Uses The atomic force microscope (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height, friction. The resolution is measured in a nanometer, which is much more accurate and effective than the optical diffraction limit. It uses a probe for measuring and collection of data involves touching the surface that has the probe. An image is formed when the scanning probe microscope raster-scans the probe over a section of the sample, measuring its local properties concurrently. They also have piezoelectric elements, which are electric charges that accumulate in selected solid materials like DNA , biological proteins, crystal, etc, to enable tiny accurate and precise movement during scanning upon an electric command. The Atomic Force Microscope was invented in 1982, by scientists working in IBM, just after the invention of the Scanning tunneling Microscope in 1980 by Ge...
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